199-208
X-ray diffraction, structural analysis, semiconductor devices, hot electrons, LED
X-ray diffraction, structural analysis, semiconductor devices, hot electrons, LED
Simulation of storage time versus reverse bias current for p+n and pin diodes
Turkish Journal of Electrical Engineering and Computer Science
Mehmet Serhat KESERLİOĞLU, Hasan Hüseyin ERKAYA
Analysis of amplitude and slope diffraction coefficients
MEHMET BARIŞ TABAKCIOĞLU, AHMET CANSIZ
Journal of Science, Technology and Engineering Research
4,4'-Diaminodifenil Sülfür Bazlı Imin Bileşiğinin Spektral ve DNA Bağlama Özellikleri
Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi
A novel approach based on reliability sensitivity analysis to allocate protective devices
Turkish Journal of Electrical Engineering and Computer Science
Hamed Hashemi DEZAKI, Hossein ASKARIAN-ABYANEH, Mehdi GARMRUDI, Hossein MAHDINIA, Kazem MAZLUMI
Structural Characterization and Magnetization of Mg0.5Cu0.5YxFe2-xO4 Ferrites
A Time Domain Uniform Geometrical Theory of Slope Diffraction for a Curved Wedge
Turkish Journal of Electrical Engineering and Computer Science